Deep Silicon Etching
High-density plasma process control for MEMS, TSV, Bosch-style workflows, and profile-sensitive silicon removal.
Equipment Platform
High-density plasma etching for silicon, MEMS, diamond, compound semiconductors, and process development where independent plasma density and ion energy control are critical.

Wafer Size
4-12 in
ICP Power
1000-3000 W
Gas Lines
5 std.
Stage Temp
-70 to 200 °C
Process-first configuration
ICP-RIE purchases usually start with materials, profile goals, wafer size, thermal control, gas chemistry, and allowable damage. This page keeps those engineering decisions visible before pushing a catalog choice.
High-density plasma process control for MEMS, TSV, Bosch-style workflows, and profile-sensitive silicon removal.
Independent source and bias control for GaN, GaAs, InP, SiC, Ga2O3, and related device research.
Configurable plasma chemistry and chuck temperature options for diamond, sapphire, and hard-to-process materials.
Core Process Windows
Separate ICP source control for high etch rate and chemistry flexibility.
Bias RF tuning helps control anisotropy, damage, and profile shape.
Configurable chuck temperature supports low-temperature and high-temperature process work.
Technical Specifications
Core values are taken from the equipment guide and presented for fast screening. Final configurations should be confirmed with engineering during quote review.
Applications
MEMS fabrication
Advanced packaging
Photonics
Power electronics
Failure analysis
Materials research
Process detail for each application area.
Research evidence
Published work using the ICP etching platform we represent · 20 papers
Sub-10-nm Lithography for Sn4-Oxo Clusters: Effect of Molecular Polarity on Sensitivity and Resolution
Advanced Functional Materials 2025
Enhanced Lithography Performance with Imino/Imido Benzenesulfonate Photoacid Generator-Bound Polymer Resists
Small 2025
Femtosecond laser fabrication of SiC microlens arrays as integrated light homogenizer and splitter
IEEE Photonics Technology Letters 2023
Biomimetic sapphire windows enabled by inside-out femtosecond laser deep-scribing
PhotoniX 2022
Single Cubic Metalens for Compact 3D Microscopic Imaging with Extended Depth of Field
ACS Photonics 2026
Broadband Complex Amplitude-Modulated Metasurfaces for Nanoprinting and Vectorial Hologram with Continuously Varying Linear Polarization Distributions
Advanced Optical Materials 2024
High-Performance Color Printing and Information Encryption Enabled by Silicon Carbide Metasurface
Advanced Functional Materials 2026
Periodic Microstructures Fabricated by Laser Interference with Subsequent Etching
Nanomaterials 2020
Non-invasive and fully two-dimensional quantitative visualization of transparent flow fields enabled by photonic spin
Light: Science & Applications 2025
Diffraction-Free Omnidirectional Antireflection Binary Metasurface via Femtosecond Laser Hybrid Etching
Advanced Materials 2026
Mitigating the Thermal Bottleneck in Polycrystalline Diamond Films by Gradient ICP Etching of the Nucleation Layer
Materials 2026
Experimental study of inductively coupled plasma etching of patterned single crystal diamonds
Scientific Reports 2025
Integration of multifocal microlens array on silicon microcantilever via femtosecond-laser-assisted etching technology
Micromachines 2022
Selenization Mechanism of Nearly 4 in. Single-Oriented PtSe2 and PtSe2/n-Si/n+-Si 2D-3D PIN Wide-Spectrum Polarization Detectors
ACS Applied Materials & Interfaces 2025
Neural-Optic Co-Designed Polarization-Multiplexed Metalens for Compact Computational Spectral Imaging
Laser & Photonics Reviews 2024
Sapphire concave microlens arrays for high-fluence pulsed laser homogenization
IEEE Photonics Technology Letters 2019
Broadband and high-speed micro-scale PtSe2/Si 2D-3D PIN photodetector for on-chip polarization-encoded communication and imaging
Applied Surface Science 2026
Rapid engraving of artificial compound eyes from curved sapphire substrate
Advanced Functional Materials 2019
Silicon three-dimensional structures fabricated by femtosecond laser modification with dry etching
Applied Optics 2017
Wear-resistant blazed gratings fabricated by etching-assisted femtosecond laser lithography
Journal of Lightwave Technology 2021
Process evidence
Peer-reviewed SEM results published by research groups working on this ICP-RIE platform family — diamond, sapphire, GaAs, and silicon. Each card names the system its paper used and links to the source.






Related Resources
Resource
Technology guide for ICP-RIE principles
Resource
Process selection comparison
Resource
DRIE and deep silicon etch primer
Resource
Wide-bandgap diamond etch guide
FAQ
The ICP-RIE platform is designed for high-aspect-ratio silicon etching, MEMS fabrication, compound semiconductor processing, diamond processing, photonics, advanced packaging, and process development where independent plasma density and ion energy control matter.
ICP-RIE uses a high-density inductively coupled plasma source with separate bias control, allowing plasma density and ion energy to be tuned independently. Standard RIE is simpler and useful for many general etch workflows, but ICP-RIE provides a wider process window for demanding research applications.
The ICP-RIE platform supports 4 inch to 12 inch wafers, with configurable loading, gas, RF, and temperature options depending on process needs.
Use this product page when you are selecting an ICP-RIE etching system, checking wafer size, ICP power, bias control, gas lines, temperature range, applications, or quote requirements. Use the ICP-RIE Technology guide when you want to learn the principles of inductively coupled plasma generation, source power, bias power, and high-density plasma etching.
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