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SEMISHARE

SEMISHARE wafer probe stations — US & Canada procurement

SEMISHARE is a wafer prober manufacturer.

NineScrolls provides US & Canada procurement, import, and support for SEMISHARE wafer probe stations.

V Series automatic probe station — product photo

Product lines

Manufacturer-confirmed product lines

Specifications below are limited to values stated in the manufacturer's official product documentation, and are confirmed with the OEM for the exact configuration before quoting.

Official product line

M/E/H Series — Manual Probe Stations

Manual probe stations in M4/M6, E4/E6/E8/E12, and H6/H8/H12 configurations.

M/E/H Series — Manual Probe Stations — product photo
M/E/H Series — Manual Probe Stations
SpecificationValue
Confirmed modelsM4 / M6; E4 / E6 / E8 / E12; H6 / H8 / H12

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

X Series — Semi-Automatic Probe Stations

Semi-automatic probe stations integrating electrical, optical, and microwave test functions.

X Series — Semi-Automatic Probe Stations — product photo
X Series — Semi-Automatic Probe Stations
SpecificationValue
ModelsX6 / X8 / X12
Temperature range-60°C to 300°C
Probe-holder contact accuracy0.6μm
Probe-holder capacityUp to 12

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

V Series — Automatic Probe Stations

V8 and V12 automatic probe stations.

V Series — Automatic Probe Stations — product photo
V Series — Automatic Probe Stations
SpecificationValue
ModelsV8 / V12
XY repeatability±1μm
XY absolute accuracy±2μm
XY resolution0.1μm
XY maximum speed100mm/s

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

A Series — Fully Automatic Mass Production Probe Stations

A8, A12, and A12S fully automatic mass production probe stations.

A Series — Fully Automatic Mass Production Probe Stations — product photo
A Series — Fully Automatic Mass Production Probe Stations
SpecificationValue
A8 wafer size6-inch / 8-inch
A8 XY repeatability±1μm
A8 XY absolute accuracy±2μm
A8 weight1200kg
A12 wafer size8-inch / 12-inch
A12 XY repeatability±1μm
A12 XY absolute accuracy±2μm
A12 weight2000kg
A12S wafer size8-inch / 12-inch
A12S XY repeatability±0.5μm
A12S XY absolute accuracy±1μm
A12S weight2000kg

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

C Series — High and Low Temperature Probe Stations

C6/C8/C12 probe stations with high and low temperature control.

C Series — High and Low Temperature Probe Stations — product photo
C Series — High and Low Temperature Probe Stations
SpecificationValue
ModelsC6 / C8 / C12
EMI shieldingIncluded
Temperature range-60°C to 300°C
Temperature resolution0.01°C
Cooling methodLiquid nitrogen / air

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

CG Series — High and Low Temperature Vacuum Probe Stations

CG-O-2, CG-O-4, and CG-C-2 high and low temperature vacuum probe stations.

CG Series — High and Low Temperature Vacuum Probe Stations — product photo
CG Series — High and Low Temperature Vacuum Probe Stations
SpecificationValue
ModelsCG-O-2 / CG-O-4 / CG-C-2
CG-O-2 / CG-O-4 temperature range77K to 473K (liquid nitrogen) / 4.2K to 473K (liquid helium)
Temperature resolution0.001K
Probe capacityUp to 6 probes
Probe landing accuracy2μm
InterfacesTriaxial / SMA / K / Fiber

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

Wafer-Level Silicon Photonics Test System

A wafer-level silicon photonics test system built on semi-automatic and fully automatic probe stations.

Wafer-Level Silicon Photonics Test System — product photo
Wafer-Level Silicon Photonics Test System
SpecificationValue
ConfigurationSpecifications available on request

Specifications from official manufacturer brochures; subject to OEM confirmation.

Official product line

Mask Cut Repair L14

Mask laser cutting and repair equipment for photomask defects.

Mask Cut Repair L14 — product photo
Mask Cut Repair L14
SpecificationValue
Stage XY travel14 × 14 inches
Z-axis travel50mm
Objective lenses5X / 10X / 20X / 50X optional / 100X optional
Optional wavelengths1064 / 532 / 355 / 266nm
Laser energy20mJ @ 1064nm / 6mJ @ 532nm / 8mJ @ 355nm
Minimum processing accuracy1 × 1μm with 100X objective

Specifications from official manufacturer brochures; subject to OEM confirmation.

Procurement

Why buy through NineScrolls

US import, done for you

Customs, tariffs, and freight handled end-to-end — your PO is in USD with delivered pricing, not an overseas wire and a customs broker to find.

Federal-ready procurement

NineScrolls LLC is SAM.gov-registered (UEI C4BFCTH5L5D1), supporting NSF/DOE-funded and other federally funded purchases.

Local support since 2018

8+ years supplying North American research labs — installation coordination and a US time-zone contact.

Research evidence

Peer-reviewed research

Published work using SEMISHARE wafer probe stations · 33 papers

  • Thermofield effects in graphite-like amorphous carbon films with nanoscale structure

    Materials 2026

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  • Magnetron sputter and phase-change optimization of wafer-level GeTe films for RF switch

    Journal of Semiconductors 2025

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  • Chain-ordered Pt atoms enable improved hydrogen production

    Nature Communications 2025

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  • Comprehensive investigation of gate-oxide instability in 4H-SiC MOSFETs and MOS capacitors

    IEEE Transactions on Electron Devices 2023

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  • Influence of temperature on transport and capacitive properties of MIM Nb2O5 nanostructures

    Applied Nano 2026

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  • A monolithic GaN driver with a deadtime generator for high-temperature GaN DC-DC buck converters

    IET Power Electronics 2023

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  • Methodology for improving temperature sensing performance and thermal stability of 4H-SiC JBS diodes

    Small 2026

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  • Detection of α-galactosidase A in dried blood spots using ion-sensitive field-effect transistors

    Sensors 2024

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  • Tailorable polarity switching and optoelectronic transition in a gate-source integrated 2D ferroelectric phototransistor

    Advanced Materials 2026

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  • One-step synergistic treatment for high-performance amorphous InGaZnO thin-film transistors

    Nanomaterials 2022

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  • Charge carrier transport and localized states in graphite-like amorphous carbon films

    Materials 2025

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  • Large enhancement of ferroelectric properties of perovskite oxides via nitrogen incorporation

    Science Advances 2025

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  • Superior energy storage performance in antiferroelectric epitaxial thin films via structural heterogeneity and orientation control

    Advanced Functional Materials 2024

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  • High-power AlGaN deep-ultraviolet micro-LED displays for maskless photolithography

    Nature Photonics 2025

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  • An air-stable microwire radial heterojunction with high photoconductivity based on a new building block

    Journal of Materials Chemistry C 2015

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  • Multiphysical field-modulated VO2 device for information encryption

    Advanced Science 2023

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  • Freestanding relaxor ferroelectric single-crystalline thin films enable flexible piezoelectric energy harvester with giant power density

    Advanced Functional Materials 2026

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  • Low ON-resistance high-purity 4H-SiC photoconductive semiconductor switch

    IEEE Transactions on Power Electronics 2023

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  • Monolithic In2Se3–In2O3 heterojunction for multibit non-volatile memory and logic operations

    npj 2D Materials and Applications 2022

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  • Nonlinear dielectric response of relaxor ferroelectric PMN-PT thin films

    Advanced Physics Research 2023

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  • Comparative analysis of carbon-capping-layer annealing on 4H-SiC MOS electrical characteristics

    Journal of Electronic Materials 2025

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  • Ultraviolet photodetector based on RbCu2I3 microwire

    Nanotechnology 2023

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  • Sub-2-nm-droplet-driven growth of amorphous metal chalcogenides approaching the single-layer limit

    Nature Materials 2025

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  • Energy band-engineered solid electrolyte interphase for stable potassium-ion batteries

    Joule 2025

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  • Infrared photodetector based on van der Waals MoS2/MoTe2 hetero-bilayer modulated by photogating

    Advanced Electronic Materials 2024

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  • Optically programmable dual-band perovskite single-pixel detector for color image encryption

    Light: Science & Applications 2026

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  • Perovskite single-pixel detector for dual-color metasurface imaging

    Light: Science & Applications 2023

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  • Self-powered lateral heterojunction photodetectors via RbCu2I3 microwire and MAPbBr3 film

    ACS Applied Electronic Materials 2024

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  • Integration of 1D lead-free perovskite microbelts onto silicon for UV-vis-NIR photodetectors

    Journal of Physical Chemistry Letters 2024

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  • Air-stable self-driven UV photodetectors on lead-free CsCu2I3 microwire arrays

    ACS Applied Materials & Interfaces 2024

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  • Stable mid-infrared polarization imaging based on quasi-2D tellurium at room temperature

    Nature Communications 2020

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  • Spiking reservoir computing based on stochastic diffusive memristors

    Advanced Electronic Materials 2025

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  • Ideal antiferroelectricity with large recoverable energy in PbZrO3 epitaxial thin films

    Nature Communications 2025

    View source

FAQ

Frequently asked questions

Who is SEMISHARE?

SEMISHARE is a wafer prober manufacturer. SEMISHARE is headquartered in Shenzhen, China. SEMISHARE was founded in 2010.

How do I buy a SEMISHARE probe station in the United States?

Request a quote through NineScrolls. We confirm your configuration with SEMISHARE, quote in USD with import and delivery included, and provide local after-sales support.

Can university and government labs purchase through NineScrolls?

Yes. NineScrolls LLC is a registered US federal supplier on SAM.gov (UEI C4BFCTH5L5D1) and has served university procurement systems since 2018.

Get a US quote for a SEMISHARE probe station

Send your application details — we confirm the exact configuration with SEMISHARE and quote with delivery and support included. New to probe stations? Start with the probe station selection hub.